STAR IST Cosmic Tests and Data Analysis
Introduction
Cosmic data were taken on Jan. 24-25 with IST detector at full running conditions, triggered with TOF.
Analysis setting:
- - Online QA (w/ IST online software): hit cut = 3
- - Calibration QA (w/ IST offline calibration: daq-->raw hit-->calibration): pedestal cut = 3
- - Offline QA and Data Analysis: (w/ full IST offline chain: daq-->raw hit-->cluster-->hit-->QA)
IST online/offline software are used to process the cosmic data, and behavior well as expected. Analysis on these data can be found below:
IST Online QA
#Run #Latency #ZS/non-ZS #time bin
Day 024
15024033 89 non-ZS 9
15024034 84 non-ZS 9
15024035 ?? non-ZS 9
15024036 ?? non-ZS 9
15024037 ?? non-ZS 9
Day 025
15025013 89 non-ZS 9
15025014 89 non-ZS 9
15025015 89 non-ZS 9
15025016 89 non-ZS 9
Day 032
15032029 88 non-ZS 9
IST Calibration QA
Day 024
15024033
15024034
15024035
15024036
15024037
Day 025
15025013
15025014
15025015
15025016
Comparisons on pedestal and RMS noise between Latency = 89 and 84 over all time bins (#15024033 - #15024034)
Time bin 0 Time bin 1 Time bin 2 Time bin 3 Time bin 4
Time bin 5 Time bin 6 Time bin 7 Time bin 8
Except very limited number of bad chips, it seems there is not big difference in pedestal and RMS noise with latency 89 and 84.
Day 032
15032029
IST Offline QA
In current offline Db tables, I masked out 35 APV chips, and their geometry IDs (numbering from 1) are: 18 on ladder 1, 7-12 and 19-24 on ladder 2, 31 on ladder 4, 13 on ladder 7, 21 on ladder 8, 15 on ladder 9, 25-36 on ladder 20, 21/23/24/35 on ladder 21, 34 on ladder 23, 17 on ladder 24.
Except for the above chips, the chip with common-mode noise bigger than 15.0 ADC counts will be masked out too in IST offline chain.
Day 083: 5 time bins setting
15083026: offline QA
Day 066:
15066074: offline QA (hltgood trigger)
15066072: offline QA (hltgood trigger)
15066065: offline QA (hltgood trigger)
Day 063:
15063047: offline QA (hft-l4 trigger)(Two misbehavioring chips 16 and 17 on ladder 11, each chip only has three hot channels readout, see page 209)
Day 054:
15054038: offline QA (hft-l4 trigger)(two hot chips found, see pages 20/183/209)
15054041: offline QA (hft-l4 trigger)(The two hot chips in run 15054038 come back.)
Day 053:
15053044: offline QA (ZS)(new bad chips: 23 on ladder 4, 7 on ladder 10, 27/28 on ladder 16, 15 on ladder 17, 14/19/31 on ladder 21, 22/24 on ladder 22)
15053044: offline QA (non-ZS)
15053044: offline QA (hft-l4 trigger)
15053045: offline QA (ZS)(new bad chips: 7 on ladder 10, 27/28 on ladder 16, 19 on ladder 21, 22/24 on ladder 22)
15053045: offline QA (non-ZS)
15053045: offline QA (hft-l4 trigger)
15053046: offline QA (ZS)(new bad chips: 7 on ladder 10, 27/28 on ladder 16, 13/19 on ladder 21, 22 on ladder 22)
15053046: offline QA (non-ZS)
15053046: offline QA (hft-l4 trigger)
Day 049:
15049075: offline QA
15049075: offline QA (with updated mapping Db)
Day 024:
15024033 (latency=89): offline QA
15024034 (latency=84):Starnge data? Only 6 ladders have hit candidates after hit cut, and most of them are non-signal hits. See offline QA plots below:
hits global X vs Y hits on ladder hits on sensor
hits on column hits on row hits Map
15024035 (latency=??): offline QA
15024036 (latency=??):Starnge data? Only 5 ladders have hit candidates after hit cut and results look the same as the run #15024034. See offline QA plots below:
hits global X vs Y hits on ladder hits on sensor
hits on column hits on row hits Map
15024036 (latency=??):Starnge data? Only 5 ladders have hit candidates after hit cut and results look the same as the run #15024034 and #15024036. See offline QA plots below:
hits global X vs Y hits on ladder hits on sensor
hits on column hits on row hits Map
Data Analysis
Day 024: IST only, TOF triggered
15024033: One bad APV chip (location: ladder=23, sensor=6, column=7-8) masked out
IST hit global X vs Y and hit multiplicity
IST MIP peak and hit max ADC time bin
15024035: Two bad APV chips (location: ladder=21, sensor=4, column=11-12; ladder=23, sensor=6, column=7-8) masked out
NOTE: max ADC time bin seems shift to the 8th; And the one-hit event plays dominatly role, which is different with other runs. Are there any special setting for APV chips during configuration?
IST hit global X vs Y and hit multiplicity
IST MIP peak and hit max ADC time bin
Day 025: IST + SSD, TOF triggered
15025013: One bad APV chip (location: ladder=23, sensor=6, column=7-8) masked out
IST hit global X vs Y and hit multiplicity
IST MIP peak and hit max ADC time bin
15025014: One bad APV chip (location: ladder=23, sensor=6, column=7-8) masked out
IST hit global X vs Y and hit multiplicity
IST MIP peak and hit max ADC time bin
15025015: Two bad APV chips (location: ladder=1, sensor=3, column=11-12; ladder=23, sensor=6, column=7-8) masked out
IST hit global X vs Y and hit multiplicity
IST MIP peak and hit max ADC time bin
15025016: Two bad APV chips (location: ladder=21, sensor=4, column=9-10; ladder=23, sensor=6, column=7-8) masked out
IST hit global X vs Y and hit multiplicity
IST MIP peak and hit max ADC time bin
Summary:
The pedestal/rms noise of IST readout channels look pretty stable except for a very limited number of misbehavioring chips. These chips will be masked out both on chip configuration level and offline calibration DBs.
The shift in global Y is caused by TPC position shift (~7 mm shift in Y axis, checked with Xin).
The MIP signal measured with IST is ~520 ADC counts (w/o track angle correction), and overall noise is ~50 ADC counts. The results are very close to IST prototype performance (Link).
The IST online and offline software (including offline calibration) behavior well as expected. More detailed check will be continued.
The runs #15024034, #15024036 and #15024037 have very strange results, and need to confirm what happened (or some special setting for APV chips).
The run #15024035 has different max ADC time bin compared with other good runs (#15024033, #15025013, #15025014, #15025014 and #15025016). Also need to confirm what happened to the chips.